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Low-threshold ablation of dielectrics irradiated by picosecond soft x-ray laser pulses.

Authors :
Faenov, A. Ya.
Inogamov, N. A.
Zhakhovskii, V. V.
Khokhlov, V. A.
Nishihara, K.
Kato, Y.
Tanaka, M.
Pikuz, T. A.
Kishimoto, M.
Ishino, M.
Nishikino, M.
Nakamura, T.
Fukuda, Y.
Bulanov, S. V.
Kawachi, T.
Source :
Applied Physics Letters; 6/8/2009, Vol. 94 Issue 23, p231107, 3p, 3 Diagrams, 1 Chart
Publication Year :
2009

Abstract

Ablation of LiF crystal by soft x-ray laser (XRL) pulses with wavelength λ=13.9 nm and duration T<subscript>L</subscript>=7 ps is studied experimentally and theoretically. It is found that a crater appears on a surface of LiF for XRL fluence, exceeding the ablation threshold F<subscript>a</subscript>∼10.2 mJ/cm<superscript>2</superscript> in one shot, or 5 mJ/cm<superscript>2</superscript> in each of the three XRL shots. This is substantially below the ablation thresholds obtained with other lasers having longer pulse duration and/or longer wavelength. A mechanism of thermomechanical ablation in large bandgap dielectrics is proposed. The theory explains the low F<subscript>a</subscript> via small attenuation depth, absence of light reflection, and electron heat conductivity. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
94
Issue :
23
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
41573103
Full Text :
https://doi.org/10.1063/1.3152290