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Guest Editorial.

Authors :
Dean Jr., Robert Neal
Luque, Antonio
Source :
IEEE Transactions on Industrial Electronics; Apr2009, Vol. 56 Issue 4, p911-912, 2p
Publication Year :
2009

Abstract

The article discusses various reports published within the issue, including the reviews on the development of microelectromechanical systems (MEMS) by Dean and Luque, new numerical method to predict the results obtained when using electron-beam lithography by Chen and Yeh, and reports on transmission lines built in alumina on a silicon substrate by Li and Uttamchandani.

Details

Language :
English
ISSN :
02780046
Volume :
56
Issue :
4
Database :
Complementary Index
Journal :
IEEE Transactions on Industrial Electronics
Publication Type :
Academic Journal
Accession number :
40305936
Full Text :
https://doi.org/10.1109/TIE.2009.2014679