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Transient simulation of lossy interconnects in VLSI by a recursive algorithm.

Authors :
Xu, Qin-Wei
Qin-Wei Xu
Li, Zheng-Fan
Zheng-Fan Li
Wang, Jun
Source :
International Journal of Electronics; Aug98, Vol. 85 Issue 2
Publication Year :
1998

Abstract

Presents a recursive algorithm for the transient simulation of the high-speed interconnects in the VLSI and multichip modules. Discretization in the s-domain; Recursive formulas; Multiconductor transmission lines; Simplified applications.

Details

Language :
English
ISSN :
00207217
Volume :
85
Issue :
2
Database :
Complementary Index
Journal :
International Journal of Electronics
Publication Type :
Academic Journal
Accession number :
3811284
Full Text :
https://doi.org/10.1080/002072198134229