Impact of misfit relaxation and a-domain formation on the electrical properties of tetragonal PbZr0.4Ti0.6O3/PbZr0.2Ti0.8O3 thin film heterostructures: Experiment and theoretical approach.

MLA

Feigl, Ludwig, et al. “Impact of Misfit Relaxation and A-Domain Formation on the Electrical Properties of Tetragonal PbZr0.4Ti0.6O3/PbZr0.2Ti0.8O3 Thin Film Heterostructures: Experiment and Theoretical Approach.” Journal of Applied Physics, vol. 105, no. 6, Mar. 2009, pp. 061607-161614. EBSCOhost, https://doi.org/10.1063/1.3056164.

APA

Feigl, L., Misirlioglu, I. B., Vrejoiu, I., Alexe, M., & Hesse, D. (2009). Impact of misfit relaxation and a-domain formation on the electrical properties of tetragonal PbZr0.4Ti0.6O3/PbZr0.2Ti0.8O3 thin film heterostructures: Experiment and theoretical approach. Journal of Applied Physics, 105(6), 061607-161614. https://doi.org/10.1063/1.3056164

Chicago

Feigl, Ludwig, I. B. Misirlioglu, Ionela Vrejoiu, Marin Alexe, and Dietrich Hesse. 2009. “Impact of Misfit Relaxation and A-Domain Formation on the Electrical Properties of Tetragonal PbZr0.4Ti0.6O3/PbZr0.2Ti0.8O3 Thin Film Heterostructures: Experiment and Theoretical Approach.” Journal of Applied Physics 105 (6): 061607-161614. doi:10.1063/1.3056164.