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Comparison of monomer and polymer resists in thermal nanoimprint lithography.

Authors :
Zelsmann, M.
Toralla, K. Perez
De Girolamo, J.
Boutry, D.
Gourgon, C.
Source :
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; Nov2008, Vol. 26 Issue 6, p2430-2433, 4p, 1 Diagram, 3 Graphs
Publication Year :
2008

Abstract

In this article, the authors compare a polymer resist to a thermally curable monomer resist in a full 8 in. wafer thermal nanoimprint lithography process. Using exactly the same imprinting conditions, the authors compare the printing quality and investigate the resist distribution through large area gratings (6×6 mm<superscript>2</superscript>) with various densities. It is shown that a liquid monomer solution greatly enhance the printing uniformity because of a much wider resist redistribution and flow during the process. Redistribution of the monomer resist is observed over an entire grating, while it is observed only over a few periods of a grating for the polymer in the same conditions. Furthermore, a low molecular weight resist allows reducing the imprinting force as well as the total cycle time. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10711023
Volume :
26
Issue :
6
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures
Publication Type :
Academic Journal
Accession number :
36259091
Full Text :
https://doi.org/10.1116/1.3013863