Precise half-life measurement of the 26Si ground state.

Authors :: Matea, I.
Souin, J.
Äystö, J.
Blank, B.
Delahaye, P.
Elomaa, V.
Eronen, T.
Giovinazzo, J.
Hager, U.
Hakala, J.
Huikari, J.
Jokinen, A.
Kankainen, A.
Moore, I.
Pedroza, J.
Rahaman, S.
Rissanen, J.
Ronkainen, J.
Saastamoinen, A.
Sonoda, T.
Source :: European Physical Journal A -- Hadrons & Nuclei; Aug2008, Vol. 37 Issue 2, p151-158, 8p, 3 Charts, 7 Graphs
Publication Year :: 2008
Abstract: The β-decay half-life of <superscript>26</superscript>Si was measured with a relative precision of 1.4·10<superscript>−3</superscript>. The measurement yields a value of 2.2283(27) s which is in good agreement with previous measurements but has a precision that is better by a factor of 4. In the same experiment, we have also measured the non-analogue branching ratios and could determine the super-allowed one with a precision of 3%. The experiment was done at the Accelerator Laboratory of the University of Jyväskylä where we used the IGISOL technique with the JYFLTRAP facility to separate pure samples of <superscript>26</superscript>Si. [ABSTRACT FROM AUTHOR]