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Electron mobility and charge correlation in silicon doped GaAs-AlAs short period superlattices.

Authors :
Bosc, F.
Sicart, J.
Robert, J. L.
Piotrzkowski, R.
Source :
Journal of Applied Physics; 8/1/2000, Vol. 88 Issue 3, p1515, 5p, 2 Diagrams, 3 Graphs
Publication Year :
2000

Abstract

Investigates the electron mobility as a function of the carrier concentration mu(n) in a silicon doped GaAs-AlAs short period superlattice at the temperature of liquid nitrogen. Tuning of the metastable electron density; Influence of charge correlations on the mobility.

Details

Language :
English
ISSN :
00218979
Volume :
88
Issue :
3
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
3396976
Full Text :
https://doi.org/10.1063/1.373848