Back to Search Start Over

Texture Defect Detection.

Authors :
Hutchison, David
Kanade, Takeo
Kittler, Josef
Kleinberg, Jon M.
Mattern, Friedemann
Mitchell, John C.
Naor, Moni
Nierstrasz, Oscar
Pandu Rangan, C.
Steffen, Bernhard
Sudan, Madhu
Terzopoulos, Demetri
Tygar, Doug
Vardi, Moshe Y.
Weikum, Gerhard
Kropatsch, Walter G.
Kampel, Martin
Hanbury, Allan
Haindl, Michal
Grim, Jiří
Source :
Computer Analysis of Images & Patterns (9783540742715); 2007, p987-994, 8p
Publication Year :
2007

Abstract

This paper presents a fast multispectral texture defect detection method based on the underlying three-dimensional spatial probabilistic image model. The model first adaptively learns its parameters on the flawless texture part and subsequently checks for texture defects using the recursive prediction analysis. We provide colour textile defect detection results that indicate the advantages of the proposed method. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISBNs :
9783540742715
Database :
Complementary Index
Journal :
Computer Analysis of Images & Patterns (9783540742715)
Publication Type :
Book
Accession number :
33316581
Full Text :
https://doi.org/10.1007/978-3-540-74272-2_122