Diffraction Lineshapes.

This chapter begins by explaining the physical origins of three types of broadening of diffraction peaks from crystalline materials: 1) small sizes of crystallites, 2) distributions of strains in crystallites, and 3) the diffractometer. These sources of peak broadenings pertain to electron diffraction, but since x-ray and neutron diffractometry data are more amenable to lineshape analysis with kinematical diffraction theory, the concepts in this chapter are presented in the context of x-ray powder diffractometry. [ABSTRACT FROM AUTHOR]