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A Two-Pass Classification Method Based on Hyper-Ellipsoid Neural Networks and SVM's with Applications to Face Recognition.

Authors :
Hutchison, David
Kanade, Takeo
Kittler, Josef
Kleinberg, Jon M.
Mattern, Friedemann
Mitchell, John C.
Naor, Moni
Nierstrasz, Oscar
Rangan, C. Pandu
Steffen, Bernhard
Sudan, Madhu
Terzopoulos, Demetri
Tygar, Doug
Vardi, Moshe Y.
Weikum, Gerhard
Derong Liu
Shumin Fei
Zengguang Hou
Huaguang Zhang
Changyin Sun
Source :
Advances in Neural Networks: ISNN 2007 (9783540723943); 2007, p461-468, 8p
Publication Year :
2007

Abstract

In this paper we propose a two-pass classification method and apply it to face recognitions. The method is obtained by integrating together two approaches, the hyper-ellipsoid neural networks (HENN's) and the SVM's with error correcting codes. This method realizes a classification operation in two passes: the first one is to get an intermediate classification result for an input sample by using the HENN's, and the second pass is followed by using the SVM's to re-classify the sample based on both the input data and the intermediate result. Simulations conducted in the paper for applications to face recognition showed that the two-pass method can maintain the advantages of both the HENN's and the SVM's while remedying their disadvantages. Compared with the HENN's and the SVM's, a significant improvement of recognition performance over them has been achieved by the new method. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISBNs :
9783540723943
Database :
Complementary Index
Journal :
Advances in Neural Networks: ISNN 2007 (9783540723943)
Publication Type :
Book
Accession number :
33155033
Full Text :
https://doi.org/10.1007/978-3-540-72395-0_59