Cite
Determination of buried interface composition and magnetism profiles using standing-wave excited soft x-ray emission and inelastic scattering.
MLA
Sell, B. C., et al. “Determination of Buried Interface Composition and Magnetism Profiles Using Standing-Wave Excited Soft x-Ray Emission and Inelastic Scattering.” Journal of Applied Physics, vol. 103, no. 8, Apr. 2008, pp. 083515-8. EBSCOhost, https://doi.org/10.1063/1.2906331.
APA
Sell, B. C., Ritchey, S. B., Yang, S.-H., Parkin, S. S. P., Watanabe, M., Mun, B. S., Plucinski, L., Mannella, N., Nambu, A., Guo, J., West, M. W., Salmassi, F., Kortright, J. B., & Fadley, C. S. (2008). Determination of buried interface composition and magnetism profiles using standing-wave excited soft x-ray emission and inelastic scattering. Journal of Applied Physics, 103(8), 083515-8. https://doi.org/10.1063/1.2906331
Chicago
Sell, B. C., S. B. Ritchey, S.-H. Yang, S. S. P. Parkin, M. Watanabe, B. S. Mun, L. Plucinski, et al. 2008. “Determination of Buried Interface Composition and Magnetism Profiles Using Standing-Wave Excited Soft x-Ray Emission and Inelastic Scattering.” Journal of Applied Physics 103 (8): 083515-8. doi:10.1063/1.2906331.