The importance of EBIT data for Z-pinch plasma diagnostics.

Authors :: Safronova, A. S.
Kantsyrev, V. L.
Neill, P.
Safronova, U. I.
Fedin, D. A.
Ouart, N. D.
Yilmaz, M. F.
Osborne, G.
Shrestha, I.
Williamson, K.
Hoppe, T.
Harris, C.
Beiersdorfer, P.
Hansen, S.
Source :: Canadian Journal of Physics; Jan2008, Vol. 86 Issue 1, p267-276, 10p, 7 Diagrams, 5 Charts, 4 Graphs
Publication Year :: 2008
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