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Crystal rotation in Cu single crystal micropillars: In situ Laue and electron backscatter diffraction.

Authors :
Maaß, R.
Van Petegem, S.
Grolimund, D.
Van Swygenhoven, H.
Kiener, D.
Dehm, G.
Source :
Applied Physics Letters; 2/18/2008, Vol. 92 Issue 7, p071905, 3p, 1 Diagram, 3 Graphs
Publication Year :
2008

Abstract

In situ microdiffraction experiments were conducted on focused ion beam machined single crystal Cu pillars oriented for double slip. During deformation, the crystal undergoes lattice rotation on both the primary and critical slip system. In spite of the initial homogeneous microstructure of the Cu pillar, rotation sets in already at yield and is more important at the top of the pillar than at the bottom, demonstrating the inhomogeneous stress state during a microcompression experiment. The rotation results are confirmed by electron backscatter diffraction measurements. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
92
Issue :
7
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
31139312
Full Text :
https://doi.org/10.1063/1.2884688