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Density Functional Theory Modeling of (001)Si--Oxynitride Interfaces.

Authors :
Stefanou, Athanasios
Source :
Journal of Electronic Materials; Feb2008, Vol. 37 Issue 2, p172-175, 4p, 1 Diagram, 1 Chart, 1 Graph
Publication Year :
2008

Abstract

Four interface models for crystalline oxynitride on (001)Si substrates are proposed and investigated. All four models are proposed to model thin oxynitride films on Si substrates, according to experimental findings and theoretical studies on amorphous oxynitride films and nitrogenated SiO<subscript>2</subscript>. State-free insulating interfaces were obtained by expanding the bulk oxynitride cell by approximately 12% and 1% along the [100] and [010] axes, respectively, and interfacing it with (001)Si. Results demonstrate state-free insulating interfaces for all models with, however, valence-band offsets slightly above or below 1 eV. The significant decrease in the valence-band offsets is mainly attributed to the significant expansion of the oxynitride's lattice constant to lattice-matched (001)Si, as well as to the high concentration of nitrogen atoms in the oxynitride bulk. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
03615235
Volume :
37
Issue :
2
Database :
Complementary Index
Journal :
Journal of Electronic Materials
Publication Type :
Academic Journal
Accession number :
28813146
Full Text :
https://doi.org/10.1007/s11664-007-0312-4