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SOI high-voltage device with step thickness sustained voltage layer.

Authors :
Luo, X.
Zhang, B.
Li, Z.
Zhang, W.
Zhan, Z.
Xu, H.
Source :
Electronics Letters (Institution of Engineering & Technology); 1/1/2008, Vol. 44 Issue 1, p55-56, 2p, 1 Diagram, 3 Graphs
Publication Year :
2008

Abstract

A new SOI high-voltage device with a step thickness sustained voltage layer (ST SOI) is proposed. The electric field in the drift region is modulated, and that in the buried layer is enhanced by the variable-thickness SOI layer, resulting in enhancement of breakdown voltage (BV). BV for the ST SOI with two steps is twice as high as that of the conventional SOI, maintaining the low on-resistance (Ron). [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00135194
Volume :
44
Issue :
1
Database :
Complementary Index
Journal :
Electronics Letters (Institution of Engineering & Technology)
Publication Type :
Academic Journal
Accession number :
28001942
Full Text :
https://doi.org/10.1049/el:20082131