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Comparative study of atomic force mode and tunneling mode tip-enhanced Raman spectroscopy.
- Source :
- European Physical Journal - Applied Physics; Nov2007, Vol. 40 Issue 2, p197-201, 5p
- Publication Year :
- 2007
-
Abstract
- In Tip-Enhanced Raman Spectroscopy (TERS) a metal (or metallized) sharp tip is used to enhance the electromagnetic field by a localized surface-plasmon excitation. Two different modes ? atomic force mode (AFM) and scanning tunneling mode (STM) ? together with their respective types of probe tips are used in TERS experiments. We have compared the efficiency in enhancing the Raman signal on a thin dye layer for metal-coated AFM tips as well as for electrochemically etched metal STM tips. A much higher enhancement factor and better reproducibility were found when using STM tips. The very different performance is mainly attributed to the more efficient plasmonic excitation when using bulk-metal tips and possibly to the morphological differences in the tip and apex shapes existing between the two tip types. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 12860042
- Volume :
- 40
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- European Physical Journal - Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 27676313
- Full Text :
- https://doi.org/10.1051/epjap:2007144