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Accurate subpixel corner detection on planar camera calibration targets.

Authors :
Paulo J. da Silva Tavares
Ma´rio A. Vaz
Source :
Optical Engineering; Oct2007, Vol. 46 Issue 10, p10720-10720, 1p
Publication Year :
2007

Abstract

Feature detectors have long been one of the touchstones of image processing. Most vision tasks are entirely dependent on the accurate determination of fiducial marks on images, which ultimately led to a quest for methods able to detect feature locations with high resolution. We report the development of an intensity-based subpixel corner detector based on the two-dimensional (2-D) Hilbert transform. Extensive testing of both accuracy and precision with live images finds the method adequate for subpixel detection at better than 10−1 pixel accuracy. The subpixel corner detectors and the evaluation proposals to date are briefly reviewed, and the proposed method is described. The results are shown and discussed. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00913286
Volume :
46
Issue :
10
Database :
Complementary Index
Journal :
Optical Engineering
Publication Type :
Academic Journal
Accession number :
27415026