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Bonding statistics and electronic structure of novel Si–B–C–N materials: Ab initio calculations and experimental verification.

Authors :
Housška, Jirří
Čapek, Jirří
Vlček, Jaroslav
Bilek, M. M. M.
McKenzie, D. R.
Source :
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Sep2007, Vol. 25 Issue 5, p1411-1416, 6p, 1 Diagram, 2 Charts, 3 Graphs
Publication Year :
2007

Abstract

Amorphous silicon-boron-carbon-nitrogen alloys were deposited by reactive magnetron sputtering, and their bonding statistics and electronic structure were investigated using a combined approach of experiment and molecular dynamics simulations. The authors show a difference between Si-based and C-based Si–B–C–N networks, and investigate coordination numbers and behavior of individual atom types. Furthermore, the authors calculate electronic structure and photoconductivity of the materials. The authors find that both a higher Si/C ratio and an addition of hydrogen increase a band gap of the materials. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
07342101
Volume :
25
Issue :
5
Database :
Complementary Index
Journal :
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films
Publication Type :
Academic Journal
Accession number :
26469934
Full Text :
https://doi.org/10.1116/1.2764081