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An Analytical Compact Circuit Model for Nanowire FET.

Authors :
Paul, Bipul C.
Tu, Ryan
Fujita, Shinobu
Okajima, Masaki
Lee, Thomas H.
Nishi, Yoshio
Source :
IEEE Transactions on Electron Devices; Jul2007, Vol. 54 Issue 7, p1637-1644, 8p, 1 Diagram, 1 Chart, 1 Graph
Publication Year :
2007

Abstract

In this paper, we propose a quasi-analytical device model of nanowire FET (NWFET) for both ballistic and drift- diffusion current transport, which can be used in any conventional circuit simulator like SPICE. The closed form expressions for current-voltage (I-V) and capacitance-voltage characteristics are obtained by analytically solving device equations with appropriate approximations. The developed model was further verified with the measured I-V characteristics of an NWFET device. Results show a close match of the model with measured data. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
54
Issue :
7
Database :
Complementary Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
25573545
Full Text :
https://doi.org/10.1109/TED.2007.899397