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Prevention of In droplets formation by HCl addition during metal organic vapor phase epitaxy of InN.

Authors :
Kang, Sang Won
Park, Hyun Jong
Won, Yong Sun
Kryliouk, Olga
Anderson, Tim
Khokhlov, Dmitry
Burbaev, Timur
Source :
Applied Physics Letters; 4/16/2007, Vol. 90 Issue 16, p161126, 3p, 1 Diagram, 3 Graphs
Publication Year :
2007

Abstract

The low decomposition temperature of InN and relatively high thermal stability of NH<subscript>3</subscript> necessitate the use of a high NH<subscript>3</subscript>/TMIn ratio to prevent In droplet formation on the surface. This work shows that the addition of Cl in the form of HCl (Cl/In molar ratio range of 0.3–1.4) to the growth chamber allows the growth of high quality InN films without the formation of a second In phase at a very low value of the N/In molar inlet ratio (2500). Photoluminescence spectra in the temperature range of 144 to 4.5 K showed a broad spectral band with a cutoff energy close to the reported minimum of the InN band gap energy (0.65 eV). [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
90
Issue :
16
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
24890642
Full Text :
https://doi.org/10.1063/1.2730582