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Focused-ion-beam milling based nanostencil mask fabrication for spin transfer torque studies.

Authors :
Özyilmaz, B.
Richter, G.
Müsgens, N.
Fraune, M.
Hawraneck, M.
Beschoten, B.
Güntherodt, G.
Bückins, M.
Mayer, J.
Source :
Journal of Applied Physics; 3/15/2007, Vol. 101 Issue 6, p063920-1, 3p, 2 Diagrams, 1 Graph
Publication Year :
2007

Abstract

Focused-ion-beam milling is used to fabricate nanostencil masks suitable for the fabrication of magnetic nanostructures relevant for spin transfer torque studies. Nanostencil masks are used to define the device dimensions prior to the growth of the thin film stack. They consist of a wet etch resistant top layer and an insulator on top of a prepatterned bottom electrode. The insulator supports a hard mask and gives rise to an undercut by its selective etching. The approach is demonstrated by fabricating current perpendicular to the plane Co/Cu/Co nanopillar junctions, which exhibit current induced magnetization dynamics. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
101
Issue :
6
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
24580537
Full Text :
https://doi.org/10.1063/1.2711785