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Fabrication and low temperature thermoelectric properties of NaxCoO2 (x=0.68 and 0.75) epitaxial films by the reactive solid-phase epitaxy.

Authors :
Chang, W. J.
Hsieh, C. C.
Chung, T. Y.
Hsu, S. Y.
Wu, K. H.
Uen, T. M.
Lin, J.-Y.
Lin, J. J.
Hsu, C.-H.
Kuo, Y. K.
Liu, H. L.
Hsu, M. H.
Gou, Y. S.
Juang, J. Y.
Source :
Applied Physics Letters; 2/5/2007, Vol. 90 Issue 6, p061917-N.PAG, 3p, 1 Diagram, 3 Graphs
Publication Year :
2007

Abstract

The authors have fabricated Na<subscript>x</subscript>CoO<subscript>2</subscript> thin films via lateral diffusion of sodium into Co<subscript>3</subscript>O<subscript>4</subscript> (111) epitaxial films (reactive solid-phase epitaxy [Ohta et al., Cryst. Growth Des. 5, 25 (2005)]). The environment of thermal diffusion is key to the control of the sodium content in thin films. From the results of x-ray diffraction and in-plane ρ<subscript>ab</subscript>, the epitaxial growth and the sodium contents of these films were identified. The thermoelectric measurements show a large thermoelectric power similar to that observed in single crystals. The quasiparticle scattering rate is found to approach zero at low temperatures, consistent with the small residual resistivity, indicating high quality of the Na<subscript>x</subscript>CoO<subscript>2</subscript> thin films. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
90
Issue :
6
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
24092088
Full Text :
https://doi.org/10.1063/1.2437131