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EXAFS Studies of Nanocrystals of Zn1-xMnxO: A Dilute Magnetic Semiconductor Oxide System.

Authors :
Chattopadhyay, S.
Kelly, S. D.
Shibata, T.
Viswanatha, R.
Balasubramanian, M.
Stoupin, S.
Segre, C. U.
Sarma, D. D.
Source :
AIP Conference Proceedings; 2007, Vol. 882 Issue 1, p809-811, 3p, 2 Charts, 3 Graphs
Publication Year :
2007

Abstract

Zn edge and Mn edge EXAFS studies have been performed on bulk and nanocrystals (4.7 nm) of the dilute magnetic semiconductor Zn1-xMnxO, with x varying from 0.05 to 0.5. Preliminary analysis and linear combination fitting shows that Mn replaces Zn in the bulk sample, whereas in the nanocrystal samples, with different amounts of Mn, only a very small percentage of the Mn atoms replace Zn. The majority of the Mn atoms remain on the surface of the nanocrystallites in the form of Mn oxides. © 2007 American Institute of Physics [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0094243X
Volume :
882
Issue :
1
Database :
Complementary Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
24065280
Full Text :
https://doi.org/10.1063/1.2644672