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High field-effect mobility ZnO thin-film transistors with Mg-doped Ba0.6Sr0.4TiO3 gate insulator on plastic substrates.
- Source :
- Applied Physics Letters; 1/22/2007, Vol. 90 Issue 4, p043502-N.PAG, 3p, 1 Diagram, 3 Graphs
- Publication Year :
- 2007
-
Abstract
- The authors report on the influence of Mg acceptor doping on the markedly reduced leakage current characteristics (<5×10<superscript>-8</superscript> A/cm<superscript>2</superscript> at 2 MV/cm) of Ba<subscript>0.6</subscript>Sr<subscript>0.4</subscript>TiO<subscript>3</subscript> thin films. The suitability of room temperature deposited Mg-doped Ba<subscript>0.6</subscript>Sr<subscript>0.4</subscript>TiO<subscript>3</subscript> films as gate insulators for low-voltage ZnO thin-film transistors (TFTs) (<6 V) was investigated. All room temperature processed ZnO-TFTs on plastic substrates exhibited a high field-effect mobility of 16.3 cm<superscript>2</superscript>/V s and a current on/off ratio of 6.4×10<superscript>4</superscript>. The threshold voltage and subthreshold swing were 2.8 V and 400 mV/decade, respectively. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 90
- Issue :
- 4
- Database :
- Complementary Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 23907011
- Full Text :
- https://doi.org/10.1063/1.2434150