Cite
Orientation dependent ferroelectric properties in samarium doped bismuth titanate thin films grown by the pulsed-laser-ablation method.
MLA
Cheng, Zhenxiang, et al. “Orientation Dependent Ferroelectric Properties in Samarium Doped Bismuth Titanate Thin Films Grown by the Pulsed-Laser-Ablation Method.” Applied Physics Letters, vol. 89, no. 3, July 2006, p. 032901. EBSCOhost, https://doi.org/10.1063/1.2221918.
APA
Cheng, Z., Kannan, C. V., Ozawa, K., Kimura, H., & Wang, X. (2006). Orientation dependent ferroelectric properties in samarium doped bismuth titanate thin films grown by the pulsed-laser-ablation method. Applied Physics Letters, 89(3), 032901. https://doi.org/10.1063/1.2221918
Chicago
Cheng, Zhenxiang, Chinna Venkatasamy Kannan, Kiyoshi Ozawa, Hideo Kimura, and Xiaolin Wang. 2006. “Orientation Dependent Ferroelectric Properties in Samarium Doped Bismuth Titanate Thin Films Grown by the Pulsed-Laser-Ablation Method.” Applied Physics Letters 89 (3): 032901. doi:10.1063/1.2221918.