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Influence of He-ion irradiation on thin NiMn/FeNi exchange bias films.
- Source :
- Journal of Applied Physics; 4/15/2006, Vol. 99 Issue 8, p08C102, 3p, 1 Black and White Photograph, 3 Graphs
- Publication Year :
- 2006
-
Abstract
- Using synchrotron x-ray diffraction and reflectivity, we studied the transition from the paramagnetic NiMn phase to the chemically ordered, antiferromagnetic L1<subscript>0</subscript> phase of NiMn/Fe<subscript>19</subscript>Ni<subscript>81</subscript> thin films deposited on a Si/SiO<subscript>2</subscript> substrate as a function of the annealing temperature. The transformation to a dominating L1<subscript>0</subscript>-ordered NiMn film takes place between 300 and 400 °C irrespective of the irradiation. This is also consistent with magnetization reversal measurements of the corresponding permalloy layers. The benefit of the ion irradiation is a reduction of the mosaicity for both the NiMn and the permalloy film, and a smoothening of internal interfaces. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 99
- Issue :
- 8
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 21126129
- Full Text :
- https://doi.org/10.1063/1.2159227