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Influence of He-ion irradiation on thin NiMn/FeNi exchange bias films.

Authors :
Cantelli, V.
von Borany, J.
Grenzer, J.
Fassbender, J.
Kaltofen, R.
Schumann, J.
Source :
Journal of Applied Physics; 4/15/2006, Vol. 99 Issue 8, p08C102, 3p, 1 Black and White Photograph, 3 Graphs
Publication Year :
2006

Abstract

Using synchrotron x-ray diffraction and reflectivity, we studied the transition from the paramagnetic NiMn phase to the chemically ordered, antiferromagnetic L1<subscript>0</subscript> phase of NiMn/Fe<subscript>19</subscript>Ni<subscript>81</subscript> thin films deposited on a Si/SiO<subscript>2</subscript> substrate as a function of the annealing temperature. The transformation to a dominating L1<subscript>0</subscript>-ordered NiMn film takes place between 300 and 400 °C irrespective of the irradiation. This is also consistent with magnetization reversal measurements of the corresponding permalloy layers. The benefit of the ion irradiation is a reduction of the mosaicity for both the NiMn and the permalloy film, and a smoothening of internal interfaces. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
99
Issue :
8
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
21126129
Full Text :
https://doi.org/10.1063/1.2159227