Characterization of surface and interface structure of YBa2Cu3O7-δ-based trilayer with La0.67Ca0.33MnO3 spacer.

Authors :: Tan, W. S.
Cai, H. L.
Liu, J. S.
Wu, X. S.
Jiang, S. S.
Wu, Z. H.
Jia, Q. J.
Gao, J.
Source :: Journal of Applied Physics; 4/15/2006, Vol. 99 Issue 8, p08M509, 3p, 1 Diagram, 2 Graphs
Publication Year :: 2006
Abstract: Thin YBa<subscript>2</subscript>Cu<subscript>3</subscript>O<subscript>7-δ</subscript>/La<subscript>0.67</subscript>Ca<subscript>0.33</subscript>MnO<subscript>3</subscript>/YBa<subscript>2</subscript>Cu<subscript>3</subscript>O<subscript>7-δ</subscript> (YBCO/LCMO/YBCO) trilayers on (001)-oriented SrTiO<subscript>3</subscript> (STO) substrates were fabricated by magnetron sputtering technique. The trilayers are well c-axis oriented confirmed by x-ray diffraction. The surface and interface structure of the trilayers were investigated by grazing incident x-ray reflectivity. The results showed that there exists diffusion at the YBCO/LCMO interfaces with the diffusion length of several nanometers. The root-mean-square (rms) roughness of surface and interface in the trilayers varied with the thickness of YBCO layer. The rms roughness of surface was consistent with observation by atomic force microscopy. A further analysis indicated that the rms roughness was correlative to the misfit strain relaxation in film. [ABSTRACT FROM AUTHOR]

Subjects :: SURFACES (Physics)
INTERFACES (Physical sciences)
SURFACE chemistry
X-ray diffraction
ATOMIC force microscopy

Full Text Access

Tools