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Compositional change of MgO barrier and interface in CoFeB/MgO/CoFeB tunnel junction after annealing.

Authors :
Bae, J. Y.
Lim, W. C.
Kim, H. J.
Lee, T. D.
Kim, K. W.
Kim, T. W.
Source :
Journal of Applied Physics; 4/15/2006, Vol. 99 Issue 8, p08T316, 3p, 1 Black and White Photograph, 4 Graphs
Publication Year :
2006

Abstract

Recent experiments have demonstrated high tunneling magnetoresistance (TMR) ratios in magnetic tunnel junctions (MTJs) with the MgO barrier. The CoFeB/MgO/CoFeB junctions showed better properties than the CoFe/MgO/CoFe junctions because the MgO layer had a good crystalline structure with (001) texture and smooth and sharp interface between CoFeB/MgO. In this work, the compositional changes in the MgO barrier and at the interface of CoFeB/MgO/CoFeB after the CoFeB crystallization were studied in annealed MTJs. X-ray photoelectron spectroscopy depth profiles were utilized for the as-deposited and 340 °C annealed specimens. Transmission electron microscope analyses showed that the MgO barrier had (100) texture on CoFeB in the junctions and CoFeB was crystallized in the annealed junctions. B in the bottom CoFeB layer diffused into the MgO barrier and B–oxide was formed at the interface of CoFeB/MgO/CoFeB after the CoFeB crystallization. The B behavior will be discussed. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
99
Issue :
8
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
21125400
Full Text :
https://doi.org/10.1063/1.2170591