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In situ energy dispersive x-ray reflectometry to investigate the (RuPc)2/NOx interaction process evidenced by ex situ measurements.

Authors :
Generosi, Amanda
Paci, Barbara
Rossi Albertini, Valerio
Perfetti, Paolo
Paoletti, Anna M.
Pennesi, Gianna
Rossi, Gentilina
Caminiti, Ruggero
Source :
Journal of Applied Physics; 2/15/2006, Vol. 99 Issue 4, p044901, 5p, 5 Graphs
Publication Year :
2006

Abstract

A systematic energy dispersive x-ray reflectometry study of different ruthenium phthalocyanine (RuPc)<subscript>2</subscript> thin films was performed in order to investigate their reactivity with the oxidizing NO<subscript>x</subscript> gas. A preliminary ex situ analysis, consisting of the comparison between the morphological parameters of different films (before and after the exposure to the gas), was performed. It suggests that a reaction involving two different mechanisms takes place. The following in situ (while fluxing the gas) reflectometry analysis confirms this hypothesis, and clarifies the temporal evolution, also revealing that the first mechanism is limited to the film surface, while the second is a bulk diffusion process. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
99
Issue :
4
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
19933576
Full Text :
https://doi.org/10.1063/1.2171778