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X-ray Spectroscopy Characterization of Carbon Nanotube Film Texture.

Authors :
Okotrub, A. V.
Belavin, V. V.
Bulusheva, L. G.
Kudashov, A. G.
Vyalikh, D. V.
Molodtsov, S. L.
Source :
AIP Conference Proceedings; 2005, Vol. 786 Issue 1, p150-153, 4p
Publication Year :
2005

Abstract

X-ray absorption spectra measured for film of the aligned multiwall carbon nanotubes at different grazing angles of incident beam showed a variation in π*/σ* peak ratio. An average deviation of carbon nanotubes from vertical orientation was estimated from comparison of the experimental data with the results quantum-chemical calculation of (6,6) carbon tube crystal. Total imperfectness of tubes ordering in the film and tube layers packing was found to be about 60°. © 2005 American Institute of Physics [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0094243X
Volume :
786
Issue :
1
Database :
Complementary Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
19015372
Full Text :
https://doi.org/10.1063/1.2103840