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X-Tolerant Test Response Compaction.

Authors :
Mitra, Subhasish
Lumetta, Steven S.
Mitzenmacher, Michael
Patil, Nishant
Source :
IEEE Design & Test of Computers; Nov/Dec2005, Vol. 22 Issue 6, p566-574, 9p, 4 Black and White Photographs, 4 Diagrams
Publication Year :
2005

Abstract

Evaluates the applications and the role of X-compact in the elimination of the bane of compression and logic Built-In Self-Test techniques. Reduction of test response data volume by up to three orders of magnitude; Impact of X-compact on test quality; Elimination of all X-sources due to timing constraints.

Subjects

Subjects :
INTEGRATED circuit design
MICROELECTRONICS
INTEGRATED circuits
MICROTECHNOLOGY
SEMICONDUCTORS
ELECTRONIC circuits

Details

Language :
English
ISSN :
07407475
Volume :
22
Issue :
6
Database :
Complementary Index
Journal :
IEEE Design & Test of Computers
Publication Type :
Academic Journal
Accession number :
18811355
Full Text :
https://doi.org/10.1109/MDT.2005.154
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