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Defects in semiconductors.

Authors :
Dreyer, Cyrus E.
Janotti, Anderson
Lyons, John L.
Wickramaratne, Darshana
Source :
Journal of Applied Physics; 11/21/2024, Vol. 136 Issue 19, p1-6, 6p
Publication Year :
2024

Details

Language :
English
ISSN :
00218979
Volume :
136
Issue :
19
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
181029300
Full Text :
https://doi.org/10.1063/5.0244142