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Single Event Transient Propagation Through Digital Optocouplers.
- Source :
- IEEE Transactions on Nuclear Science; Aug2005, Vol. 52 Issue 4, p1136-1139, 4p
- Publication Year :
- 2005
-
Abstract
- A new approach for assessing the risk of upsetting digital optocouplers due to the propagation of single event transients (SETs) is proposed. The optocoupler's input current (I<subscript>f</subscript>) and propagation time (t<subscript>pHL</subscript>) are found to be the most critical parameters for this approach. A case study using the 6N140 optocoupler and SETs measured at the output of the National Semi- conductor LM139 is detailed to validate the concept. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 52
- Issue :
- 4
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- 18099244
- Full Text :
- https://doi.org/10.1109/TNS.2005.851746