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Single Event Transient Propagation Through Digital Optocouplers.

Authors :
Adell, P. C.
Mion, O.
Schrimpf, R. D.
Chatry, C.
Calvel, P.
Melotte, M. R.
Source :
IEEE Transactions on Nuclear Science; Aug2005, Vol. 52 Issue 4, p1136-1139, 4p
Publication Year :
2005

Abstract

A new approach for assessing the risk of upsetting digital optocouplers due to the propagation of single event transients (SETs) is proposed. The optocoupler's input current (I<subscript>f</subscript>) and propagation time (t<subscript>pHL</subscript>) are found to be the most critical parameters for this approach. A case study using the 6N140 optocoupler and SETs measured at the output of the National Semi- conductor LM139 is detailed to validate the concept. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189499
Volume :
52
Issue :
4
Database :
Complementary Index
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
18099244
Full Text :
https://doi.org/10.1109/TNS.2005.851746