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A comprehensive survey of recent research on profile data analysis.

Authors :
Liu, Peiyao
Xu, Haijie
Zhang, Chen
Source :
Journal of Quality Technology; 2024, Vol. 56 Issue 5, p428-454, 27p
Publication Year :
2024

Abstract

Nowadays advanced sensing technology enables high-resolution in-process data collection in various systems, known as profile data. These data facilitate in-process monitoring and anomaly detection, which have been extensively studied in recent years. This paper conducts a comprehensive survey on the recent literature for profile modeling and monitoring, including linear profiles, nonlinear profiles, spatial profiles, multi-stage profiles, profile network data, and partially observable profiles, covering techniques such as functional data analysis, tensor analysis, deep learning, etc. By summarizing the developments and challenges associated with the reviewed papers, this paper aims to provide researchers and practitioners with a valuable resource for understanding the latest research advances. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00224065
Volume :
56
Issue :
5
Database :
Complementary Index
Journal :
Journal of Quality Technology
Publication Type :
Academic Journal
Accession number :
180919613
Full Text :
https://doi.org/10.1080/00224065.2024.2369933