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Defect Engineering: Can it Mitigate Strong Coulomb Effect of Mg2+ in Cathode Materials for Rechargeable Magnesium Batteries?
- Source :
- Nano-Micro Letters; 9/20/2024, Vol. 17 Issue 1, p1-25, 25p
- Publication Year :
- 2024
-
Abstract
- Highlights: The underlying migration mechanism of Mg<superscript>2+</superscript> in cathode materials and roles of defects in Mg<superscript>2+</superscript> migration in cathode materials were studied. Applications of defect engineering to Mg<superscript>2+</superscript> migration in cathode materials and the strategies for introducing various defects were summarized. New development directions of defect engineering in cathode materials for rechargeable magnesium battery were prospected Rechargeable magnesium batteries (RMBs) have been considered a promising "post lithium-ion battery" system to meet the rapidly increasing demand of the emerging electric vehicle and grid energy storage market. However, the sluggish diffusion kinetics of bivalent Mg<superscript>2+</superscript> in the host material, related to the strong Coulomb effect between Mg<superscript>2+</superscript> and host anion lattices, hinders their further development toward practical applications. Defect engineering, regarded as an effective strategy to break through the slow migration puzzle, has been validated in various cathode materials for RMBs. In this review, we first thoroughly understand the intrinsic mechanism of Mg<superscript>2+</superscript> diffusion in cathode materials, from which the key factors affecting ion diffusion are further presented. Then, the positive effects of purposely introduced defects, including vacancy and doping, and the corresponding strategies for introducing various defects are discussed. The applications of defect engineering in cathode materials for RMBs with advanced electrochemical properties are also summarized. Finally, the existing challenges and future perspectives of defect engineering in cathode materials for the overall high-performance RMBs are described. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 23116706
- Volume :
- 17
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- Nano-Micro Letters
- Publication Type :
- Academic Journal
- Accession number :
- 180655036
- Full Text :
- https://doi.org/10.1007/s40820-024-01495-1