Face Index of Silicon Carbide Structures: An Alternative Approach.

Face index is a critical topological descriptor that provides important information about the structural variations of various materials. Initially introduced as a novel metric, the face index has become essential in characterizing the complexity and properties of molecular structures like silicate networks, carbon sheets, and nanotubes. This analysis focuses on the face index within the Silicon Carbide structure, highlighting its profound significance as a pivotal structural descriptor. By shedding light on its implications for the fundamental properties of three different Silicon Carbide structures: S i 2 C 3 -I[m, n], S i 2 C 3 -II[m, n] and S i 2 C 3 -III[m, n], this study aims to advance our understanding of the structural complexities and potential applications of this unique material system. [ABSTRACT FROM AUTHOR]