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Fabrication of field-effect transistor device with higher fullerene, C88.
- Source :
- Applied Physics Letters; 7/11/2005, Vol. 87 Issue 2, p023501, 3p, 3 Graphs
- Publication Year :
- 2005
-
Abstract
- A fullerene field-effect transistor (FET) device has been fabricated with thin films of C<subscript>88</subscript>, and n-channel normally on depletion-type FET properties have been found in this FET device. The C<subscript>88</subscript> FET exhibited a high mobility, μ, of 2.5×10<superscript>-3</superscript> cm<superscript>2</superscript> V<superscript>-1</superscript> s<superscript>-1</superscript> at 300 K, in fullerene FETs. The carrier transport showed a thermally activated hopping transport. The n-channel normally on FET properties and the hopping transport reflect the small mobility gap and low carrier concentration in the channel region of C<subscript>88</subscript> thin films. [ABSTRACT FROM AUTHOR]
- Subjects :
- FIELD-effect transistors
FULLERENES
TRANSISTORS
THIN films
FULLERENE thin films
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 87
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 18008206
- Full Text :
- https://doi.org/10.1063/1.1994957