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Fabrication of field-effect transistor device with higher fullerene, C88.

Authors :
Nagano, Takayuki
Sugiyama, Hiroyuki
Kuwahara, Eiji
Watanabe, Rie
Kusai, Haruka
Kashino, Yoko
Kubozono, Yoshihiro
Source :
Applied Physics Letters; 7/11/2005, Vol. 87 Issue 2, p023501, 3p, 3 Graphs
Publication Year :
2005

Abstract

A fullerene field-effect transistor (FET) device has been fabricated with thin films of C<subscript>88</subscript>, and n-channel normally on depletion-type FET properties have been found in this FET device. The C<subscript>88</subscript> FET exhibited a high mobility, μ, of 2.5×10<superscript>-3</superscript> cm<superscript>2</superscript> V<superscript>-1</superscript> s<superscript>-1</superscript> at 300 K, in fullerene FETs. The carrier transport showed a thermally activated hopping transport. The n-channel normally on FET properties and the hopping transport reflect the small mobility gap and low carrier concentration in the channel region of C<subscript>88</subscript> thin films. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
87
Issue :
2
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
18008206
Full Text :
https://doi.org/10.1063/1.1994957