MnBi 2 Te 4 Thin-Film Photodetector with a Millisecond Response Speed and Long-Term Air Stability.

Topological materials with well-defined surfaces and edges have become a prominent research topic. As topological insulators, MnBi₂Te₄ thin films, with their unique surfaces, exhibit exceptional electron transport properties and good applicability in low-noise, high-sensitivity photoelectric detection. This paper reports a straightforward, efficient, and cost-effective thermal evaporation method for preparing quantum MnBi₂Te₄ thin films, along with an investigation into their photoelectric detection performance. These films can be used to fabricate array devices, with the resulting photodetectors achieving a response current of 97 mA W⁻¹ at room temperature and a response speed of <1 ms. Moreover, they demonstrate stability in the air for >30 d, with the photoelectric performance degrading by <15%. Our research introduces a new application for topological materials in photoelectric detection and establishes a strong foundation for the design and development of high-performance photodetectors in the future. [ABSTRACT FROM AUTHOR]