Rapid and Noise‐Resilient Mapping of Photogenerated Carrier Lifetime in Halide Perovskite Thin Films.

Halide perovskite materials offer significant promise for solar energy and optoelectronics yet understanding and enhancing their efficiency and stability require addressing lateral inhomogeneity challenges. While photoluminescence imaging techniques are employed for the measurement of their opto‐electronic and transport properties, going further in terms of precision requires longer acquisition times. Prolonged exposure of perovskites to light, given their high reactivity, can substantially alter these layers, rendering the acquired data less meaningful for analysis. In this paper, a method to extract high‐quality lifetime images from rapidly acquired, noisy time‐resolved photoluminescence images is proposed. This method leverages concepts of the field of constrained reconstruction and includes the Huber loss function and a specific form of total variation regularization. Through both simulations and experiments, it is demonstrated that the approach outperforms conventional pointwise methods. Optimal acceleration and optimization parameters tailored for decay time imaging of perovskite materials, offering new perspectives for accelerated experiments crucial in degradation process characterization are identified. Importantly, this methodology holds the potential for broader applications: it can be extended to explore additional beam‐sensitive materials, and other imaging characterization techniques and employed with more complex physical models to treat time‐resolved decays. [ABSTRACT FROM AUTHOR]