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Fcc-Based Superstructure in CrCoNi System Induced by Annealing of Amorphous Cr-Co-Ni-Si-B-P Alloy.

Authors :
Kawamata, T.
Ban, T.
Shibata, M.
Murayama, H.
Yasuhara, A.
Yubuta, K.
Sugiyama, K.
Source :
Materials Transactions; 2024, Vol. 65 Issue 9, p1034-1040, 7p
Publication Year :
2024

Abstract

Chemically ordered face-centered cubic (fcc) phases consisting mainly of Cr, Co, and Ni were synthesized by annealing a Cr<subscript>26.7</subscript>Co<subscript>26.7</subscript>Ni<subscript>26.7</subscript>Si<subscript>10</subscript>B<subscript>5</subscript>P<subscript>5</subscript> amorphous alloy. The annealed Cr<subscript>26.7</subscript>Co<subscript>26.7</subscript>Ni<subscript>26.7</subscript>Si<subscript>10</subscript>B<subscript>5</subscript>P<subscript>5</subscript> sample was composed of Cr<subscript>4.5</subscript>BP<subscript>2</subscript>, Cr<subscript>3</subscript> Co<subscript>5</subscript>Si<subscript>2</subscript>, and fcc phases. Synchrotron radiation anomalous X-ray scattering (AXS) measurements confirmed that the annealed Cr<subscript>26.7</subscript>Co<subscript>26.7</subscript>Ni<subscript>26.7</subscript>Si<subscript>10</subscript>B<subscript><subscript>5</subscript></subscript>P<subscript>5</subscript> sample had superlattice reflections from an L1<subscript>0-</subscript>, and/or L1<subscript>2-</subscript>, and D0<subscript>22</subscript>-type ordered structure. The diffraction intensities of the superlattice reflections observed in the AXS measurements indicated strong dependence on the incident X-ray energy. The diffraction intensity of the superlattice reflection increased at the X-ray energy near the K-edge of Cr, suggesting that Cr is mainly ordered in the L1<subscript>0-</subscript> and D0<subscript>22</subscript>-type structures. Microstructural analysis using scanning transmission electron microscopy (STEM) revealed crystal grains with diameters of approximately 20 nm, showing diffraction spots corresponding to superlattice reflections of 001 and 110, in addition to a two-dimensional diffraction pattern corresponding to the fcc structure. Simultaneous STEM--energy dispersive X-ray spectroscopy analysis indicated that the grains had a higher Cr concentration than the mother alloy composition of Cr<subscript>26.7</subscript>Co<subscript>26.7</subscript>Ni<subscript>26.7</subscript>Si<subscript>10</subscript>B<subscript>5</subscript>P<subscript>5</subscript>. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
13459678
Volume :
65
Issue :
9
Database :
Complementary Index
Journal :
Materials Transactions
Publication Type :
Academic Journal
Accession number :
179992319
Full Text :
https://doi.org/10.2320/matertrans.MT-MA2024008