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Cloud-Edge Collaborative Defect Detection Based on Efficient Yolo Networks and Incremental Learning.

Authors :
Lei, Zhenwu
Zhang, Yue
Wang, Jing
Zhou, Meng
Source :
Sensors (14248220); Sep2024, Vol. 24 Issue 18, p5921, 18p
Publication Year :
2024

Abstract

Defect detection constitutes one of the most crucial processes in industrial production. With a continuous increase in the number of defect categories and samples, the defect detection model underpinned by deep learning finds it challenging to expand to new categories, and the accuracy and real-time performance of product defect detection are also confronted with severe challenges. This paper addresses the problem of insufficient detection accuracy of existing lightweight models on resource-constrained edge devices by presenting a new lightweight YoloV5 model, which integrates four modules, SCDown, GhostConv, RepNCSPELAN4, and ScalSeq. Here, this paper abbreviates it as SGRS-YoloV5n. Through the incorporation of these modules, the model notably enhances feature extraction and computational efficiency while reducing the model size and computational load, making it more conducive for deployment on edge devices. Furthermore, a cloud-edge collaborative defect detection system is constructed to improve detection accuracy and efficiency through initial detection by edge devices, followed by additional inspection by cloud servers. An incremental learning mechanism is also introduced, enabling the model to adapt promptly to new defect categories and update its parameters accordingly. Experimental results reveal that the SGRS-YoloV5n model exhibits superior detection accuracy and real-time performance, validating its value and stability for deployment in resource-constrained environments. This system presents a novel solution for achieving efficient and accurate real-time defect detection. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
14248220
Volume :
24
Issue :
18
Database :
Complementary Index
Journal :
Sensors (14248220)
Publication Type :
Academic Journal
Accession number :
179964585
Full Text :
https://doi.org/10.3390/s24185921