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Improved oxidation behavior of Hf0.11Al0.20B0.69 in comparison to Hf0.28B0.72 magnetron sputtered thin films.

Authors :
Kümmerl, Pauline
Lellig, Sebastian
Navidi Kashani, Amir Hossein
Hans, Marcus
Pöllmann, Peter J.
Löfler, Lukas
Nayak, Ganesh Kumar
Holzapfel, Damian M.
Kolozsvári, Szilárd
Polcik, Peter
Schweizer, Peter
Primetzhofer, Daniel
Michler, Johann
Schneider, Jochen M.
Source :
Scientific Reports; 9/17/2024, Vol. 14 Issue 1, p1-13, 13p
Publication Year :
2024

Abstract

The oxidation resistance of Hf<subscript>0.28</subscript>B<subscript>0.72</subscript> and Hf<subscript>0.11</subscript>Al<subscript>0.20</subscript>B<subscript>0.69</subscript> thin films was investigated comparatively at 700 °C for up to 8 h. Single-phase solid solution thin films were co-sputtered from HfB<subscript>2</subscript> and AlB<subscript>2</subscript> compound targets. After oxidation at 700 °C for 8 h an oxide scale thickness of 31 ± 2 nm was formed on Hf<subscript>0.11</subscript>Al<subscript>0.20</subscript>B<subscript>0.69</subscript> which corresponds to 14% of the scale thickness measured on Hf<subscript>0.28</subscript>B<subscript>0.72</subscript>. The improved oxidation resistance can be rationalized based on the chemical composition and the morphology of the formed oxide scales. On Hf<subscript>0.28</subscript>B<subscript>0.72</subscript> the formation of a porous, O, Hf, and B-containing scale and the formation of crystalline HfO<subscript>2</subscript> is observed. Whereas on Hf<subscript>0.11</subscript>Al<subscript>0.20</subscript>B<subscript>0.69</subscript> a dense, primarily amorphous scale containing O, Al, B as well as approximately 3 at% of Hf forms, which reduces the oxidation kinetics significantly by passivation. Benchmarking Hf<subscript>0.11</subscript>Al<subscript>0.20</subscript>B<subscript>0.69</subscript> with Ti–Al-based boride and nitride thin films with similar Al concentrations reveals superior oxidation behavior of the Hf-Al-based thin film. The incorporation of few at% of Hf in the oxide scale decelerates oxidation kinetics at 700 °C and leads to a reduction in oxide scale thickness of 21% and 47% compared to Ti<subscript>0.12</subscript>Al<subscript>0.21</subscript>B<subscript>0.67</subscript> and Ti<subscript>0.27</subscript>Al<subscript>0.21</subscript>N<subscript>0.52</subscript>, respectively. Contrary to Ti–Al-based diborides, Hf<subscript>0.11</subscript>Al<subscript>0.20</subscript>B<subscript>0.69</subscript> shows excellent oxidation behavior despite B-richness. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20452322
Volume :
14
Issue :
1
Database :
Complementary Index
Journal :
Scientific Reports
Publication Type :
Academic Journal
Accession number :
179761153
Full Text :
https://doi.org/10.1038/s41598-024-72134-3