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Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy.
- Source :
- Journal of Applied Physics; 8/1/2005, Vol. 98 Issue 3, p033533, 7p, 1 Black and White Photograph, 2 Diagrams, 7 Graphs
- Publication Year :
- 2005
-
Abstract
- Buried channel waveguide amplifiers in erbium/ybtterbium codoped phosphate glass were fabricated using proton-beam writing. Single-mode waveguides were fabricated with fluences ranging from 0.4 to 2.0×10<superscript>15</superscript> particles/cm<superscript>2</superscript>. The end-of-range and surface profiles of the waveguides were investigated using atomic force microscopy. The waveguiding effect was investigated using the end-fire coupling technique. From the near-field mode profiles, the refractive index profiles of these waveguides were recovered using the propagation mode near-field method. From these results, it can be deduced that for phosphate glass waveguides fabricated with fluences <1.0×10<superscript>15</superscript> particles/cm<superscript>2</superscript>, the ionization from the electronic stopping, rather than the nuclear damage processes, is the major contributing factor leading to an increase in the refractive index near the end of range. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 98
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 17961169
- Full Text :
- https://doi.org/10.1063/1.2001748