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Impact of crystallite size of LiCu0.5Fe2-yCeyO4 nanospinel ferrites on opto-dielectric properties.

Authors :
Taleb, Manal F. Abou
Afzal, F.
Hussain, Q.
Ibrahim, Mohamed M.
El-Bahy, Zeinhom M.
Rahman, A. U.
Source :
Journal of Materials Science: Materials in Electronics; Sep2024, Vol. 35 Issue 26, p1-13, 13p
Publication Year :
2024

Abstract

This study explores the impact of crystallite size on the opto-dielectric properties of LiCu<subscript>0.5</subscript>Fe<subscript>2-y</subscript>Ce<subscript>y</subscript>O<subscript>4</subscript> (y = 0.0, 0.01, 0.02, 0.03, 0.04) nanospinel ferrites (NSFs) synthesized via sol–gel auto-combustion. X-ray diffraction (XRD) analysis confirmed the crystalline nature and phase purity, revealing variations in crystallite size within the nanoscale range. Fourier-transform infrared spectroscopy (FTIR) provided insights into chemical bonding, affirming the composition and structure reliability. Morphological characterization via scanning electron microscopy (SEM) and transmission electron microscopy (TEM) revealed the nanostructure, highlighting the influence of crystallite size on particle morphology, shape, and size distribution. Energy-dispersive X-ray spectroscopy (EDX) verified the presence of expected elements, with elemental composition offering spatial distribution insights. Inductively coupled plasma (ICP) analysis quantified elemental concentrations, focusing on Li, Cu, Fe, and Ce. Optical properties, including UV–vis absorption spectra, were measured to assess band gap energies. Dielectric measurements across a range of frequencies provided insights into the pure Li-Cu NSFs and Ce<superscript>3+</superscript> doped Li-Cu NSFs dielectric response, revealing variations in dielectric constant and loss tangent with changing crystallite size. The findings highlighted the significant role of crystallite size in modulating both energy band gap and dielectric properties, essential for applications in high-frequency, photonics, electronics, and sensor technologies. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09574522
Volume :
35
Issue :
26
Database :
Complementary Index
Journal :
Journal of Materials Science: Materials in Electronics
Publication Type :
Academic Journal
Accession number :
179574676
Full Text :
https://doi.org/10.1007/s10854-024-13461-z