Hyperspectral full‐field quick‐EXAFS imaging at the ROCK beamline for monitoring micrometre‐sized heterogeneity of functional materials under process conditions.

MLA

Briois, Valérie, et al. “Hyperspectral Full‐field Quick‐EXAFS Imaging at the ROCK Beamline for Monitoring Micrometre‐sized Heterogeneity of Functional Materials under Process Conditions.” Journal of Synchrotron Radiation, vol. 31, no. 5, Sept. 2024, pp. 1084–104. EBSCOhost, https://doi.org/10.1107/S1600577524006581.

APA

Briois, V., Itié, J. P., Polian, A., King, A., Traore, A. S., Marceau, E., Ersen, O., La Fontaine, C., Barthe, L., Beauvois, A., Roudenko, O., & Belin, S. (2024). Hyperspectral full‐field quick‐EXAFS imaging at the ROCK beamline for monitoring micrometre‐sized heterogeneity of functional materials under process conditions. Journal of Synchrotron Radiation, 31(5), 1084–1104. https://doi.org/10.1107/S1600577524006581

Chicago

Briois, Valérie, Jean Paul Itié, Alain Polian, Andrew King, Aliou Sadia Traore, Eric Marceau, Ovidiu Ersen, et al. 2024. “Hyperspectral Full‐field Quick‐EXAFS Imaging at the ROCK Beamline for Monitoring Micrometre‐sized Heterogeneity of Functional Materials under Process Conditions.” Journal of Synchrotron Radiation 31 (5): 1084–1104. doi:10.1107/S1600577524006581.