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Effects of adding methane on the growth and electrical properties of GaN in oxide vapor phase epitaxy.

Authors :
Usami, S.
Higashiyama, R.
Imanishi, M.
Takino, J.
Sumi, T.
Okayama, Y.
Yoshimura, M.
Hata, M.
Isemura, M.
Mori, Y.
Source :
Journal of Applied Physics; 8/28/2024, Vol. 136 Issue 8, p1-7, 7p
Publication Year :
2024

Abstract

GaN grown via oxide vapor phase epitaxy (OVPE-GaN) can produce free-standing substrates with ultra-low resistivity because of the high doping concentration of oxygen. The bulk growth of OVPE-GaN is hindered by polycrystals generated during long-term growth. We have previously reported that thicker films can be grown by reducing the partial pressure of water vapor in the growth atmosphere with CH<subscript>4</subscript>. However, as CH<subscript>4</subscript> is a dopant of carbon, a compensating acceptor, its addition may increase electrical resistance. In this study, we further investigated the effect of reducing water vapor partial pressure on polycrystals by combining Ga<subscript>2</subscript>O production (reaction of Ga and water vapor: a Ga–H<subscript>2</subscript>O system), which can reduce water vapor, with CH<subscript>4</subscript> addition. However, CH<subscript>4</subscript> addition to the Ga–H<subscript>2</subscript>O system increased polycrystal generation, possibly owing to the thermal decomposition of excess CH<subscript>4</subscript>. The properties of OVPE-GaN with CH<subscript>4</subscript> addition were also evaluated. Although the CH<subscript>4</subscript> addition resulted in high carbon doping, the carbon-doped OVPE-GaN maintained low resistivity. This is because the OVPE method involves three-dimensional growth with growth pits, and the growth pits leave behind low-resistivity high-oxygen-concentration regions. As the resistivity remains low even when CH<subscript>4</subscript> is added in the OVPE method, both polycrystallization suppression and low resistivity can be achieved by selecting an appropriate CH<subscript>4</subscript> flow rate. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
136
Issue :
8
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
179373865
Full Text :
https://doi.org/10.1063/5.0211640