Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks.

MLA

Yen, Chia-Heng, et al. “Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks.” IEEE Transactions on Semiconductor Manufacturing, vol. 37, no. 3, Aug. 2024, pp. 280–92. EBSCOhost, https://doi.org/10.1109/TSM.2024.3406395.

APA

Yen, C.-H., Wang, T.-R., Liu, C.-M., Yang, C.-H., Chen, C.-T., Chen, Y.-Y., Lee, J.-N., Kao, S.-Y., Wu, K.-C., & Chao, M. C.-T. (2024). Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks. IEEE Transactions on Semiconductor Manufacturing, 37(3), 280–292. https://doi.org/10.1109/TSM.2024.3406395

Chicago

Yen, Chia-Heng, Ting-Rui Wang, Ching-Min Liu, Cheng-Hao Yang, Chun-Teng Chen, Ying-Yen Chen, Jih-Nung Lee, Shu-Yi Kao, Kai-Chiang Wu, and Mango Chia-Tso Chao. 2024. “Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks.” IEEE Transactions on Semiconductor Manufacturing 37 (3): 280–92. doi:10.1109/TSM.2024.3406395.