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Digital Self-Interference Cancellation for Full-Duplex Systems Based on CNN and GRU.
- Source :
- Electronics (2079-9292); Aug2024, Vol. 13 Issue 15, p3041, 17p
- Publication Year :
- 2024
-
Abstract
- Self-interference (SI) represents a bottleneck in the performance of full-duplex (FD) communication systems, necessitating robust offsetting techniques to unlock the potential of FD systems. Currently, deep learning has been leveraged within the communication domain to address specific challenges and enhance efficiency. Inspired by this, this paper reviews the self-interference cancellation (SIC) process in the digital domain focusing on SIC capability. The paper introduces a model architecture that integrates CNN and gated recurrent unit (GRU), while also incorporating residual networks and self-attention mechanisms to enhance the identification and elimination of SI. This model is named CGRSA-Net. Firstly, CNN is employed to capture local signal features in the time–frequency domain. Subsequently, a ResNet module is introduced to mitigate the gradient vanishing problem. Concurrently, GRU is utilized to dynamically capture and retain both long- and short-term dependencies during the communication process. Lastly, by integrating the self-attention mechanism, attention weights are flexibly assigned when processing sequence data, thereby focusing on the most important parts of the input sequence. Experimental results demonstrate that the proposed CGRSA-Net model achieves a minimum of 28% improvement in nonlinear SIC capability compared to polynomial and existing neural network-based eliminator. Additionally, through ablation experiments, we demonstrate that the various modules utilized in this paper effectively learn signal features and further enhance SIC performance. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 20799292
- Volume :
- 13
- Issue :
- 15
- Database :
- Complementary Index
- Journal :
- Electronics (2079-9292)
- Publication Type :
- Academic Journal
- Accession number :
- 178947703
- Full Text :
- https://doi.org/10.3390/electronics13153041