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An Investigation on 3D Electron Diffraction and 4-Dimensional Scanning Diffraction Tomography Using a Scanning Electron Microscope.

Authors :
Gholam, Saleh
Denisov, Nikita
Orekhov, Andrey
Verbeeck, Johan
Hadermann, Joke
Source :
Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-3, 3p
Publication Year :
2024

Details

Language :
English
ISSN :
14319276
Volume :
30
Database :
Complementary Index
Journal :
Microscopy & Microanalysis
Publication Type :
Academic Journal
Accession number :
178928707
Full Text :
https://doi.org/10.1093/mam/ozae044.317