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Analyzing Surface Relaxation in TEM-Lamella: A Method for Revealing Alloy Concentrations at Strained Semiconductor Interfaces.
- Source :
- Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-5, 5p
- Publication Year :
- 2024
Details
- Language :
- English
- ISSN :
- 14319276
- Volume :
- 30
- Database :
- Complementary Index
- Journal :
- Microscopy & Microanalysis
- Publication Type :
- Academic Journal
- Accession number :
- 178928533
- Full Text :
- https://doi.org/10.1093/mam/ozae044.142